Joseph Federico, NJ Micro Electronic Testings Vice President and Director of Operations hosted Lieutenant Governor Kim Guadagno as well as principal members of NJs Department of State on Thursday, October 27th 2011. They came to commend the laboratorys accomplishments for over 30 years of quality military, aerospace and industrial testing as well as to discuss future corporate incentives to benefit corporations throughout New Jersey.
The hour long meeting focused on future state incentives which could benefit NJ Micro Electronic Testing and other companies like it. The incentives discussed included Employment Incentives, High Tech Manufacturing and Testing Incentives, Real Estate Resources, and Business Technology Advances in concert with The NJ Institute of Technology.
Lt. Governor Guadagno is the first Lieutenant Governor of NJ, having won the 2009 Election as the running mate of Governor Chris Christie.
I feel she is doing wonderful job in helping companies in New Jersey by publicizing these corporate incentives to spur economic growth, said Joseph Federico of NJ Micro Electronic Testing. (http://joefedericonj.com). The meeting included a full tour of the laboratory and a meet-and-greet session with all the employees.
During her visit to NJ Micro Electronic Testing, Guadagno noted that NJ Micro Electronic Testing has more than doubled its number of employees since 2000.
Publicity about NJ Micro Electronic Testings Mission Imposter Counterfeit Detection program attracted the attention of her Department of State staff. Specifically, they viewed the Heartbeat of America video available on YouTube, Joseph Federico said.
Clifton, New Jersey based NJ Micro Electronic Testing was formed 30 years ago to provide a wide and diversified range of laboratory test and management services. Utilizing 32,000 square feet of laboratory test stations and offices on three floors, NJ Micro Electronic Testing is equipped and staffed to be a single source provider for all testing needs. The Mission Imposter program involves a series of very detailed tests to identify cloned and counterfeit electronic components.
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